The Basic Contact Probe F56214S250L200H (item number 1024575) is a spring-loaded probe for temporary electrical contact with test points. With tip style 14 (4-point crown stepped (self-cleaning)), F56214S250L200H combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F56214S250L200H combines a pitch of 2.54 mm / 100 mil with tip style 14 (4-point crown stepped (self-cleaning)) and a tip diameter of 2.5 mm. For F56214S250L200H, spring force is 200 cN at a nominal travel of 2.7 mm. F56214S250L200H is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F56214S250L200H is made of steel and uses Longtime Gold plating. The final H identifies the high-temperature version; F56214S250L200H is suitable for applications up to 200 °C.
