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FP280D0301P013U030L057 Perspective 1 FP280D0301P013U030L057 Perspective 2

Fine Pitch Probes (< 300µm) FP280D0301P013U030L057

Item number 1030726

Technical data sheet

Quantity

Technical data

General
Structure Double Plunger Probe
Type/family FP-D
Pitch (mm/mil) 0,35 / 14
Temperature -45°C...+120°C
Dimensions
Total length (mm) 5.7
Protrusion height (mm) 1.1
Tip style diameter (mm) 0.13
Barrel diameter (mm) 0.28
Tip style diameter (mm) 2 0.13
Materials and surfaces
Tip style 03
Tip style 2 01
Plunger material Palladium
Plunger plating Uncoated
Barrel material Bronze
Barrel plating Gold
Spring material Spring steel
Spring plating Gold
Plunger material 2 Beryllium copper
Plunger plating 2 Gold
Mechanical specifications
Preload (cN) 6
Spring force (cN) 30
Nominal travel (mm) 0.65
Maximum travel (mm) 1
Electrical specifications
Continuous current (A) 1.5
Typical contact resistance (mOhm) 100
Frequency (GHz) 11.5

Graphics

FP280D0301P013U030L057 Family designation FP280D0301P013U030L057 Tip style 1 FP280D0301P013U030L057 Tip style 2

Beschreibung des Produkts

The Fine Pitch Double Plunger Probe FP280D0301P013U030L057 (item number 1030726) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP280D0301P013U030L057 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP280D0301P013U030L057, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.35 mm / 14 mil, spring force 30 cN, continuous current 1.5 A.