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FP280D2903P016U020L057 Perspective 1 FP280D2903P016U020L057 Perspective 2

Fine Pitch Probes (< 300µm) FP280D2903P016U020L057

Item number 1081003

Technical data sheet

Quantity

Technical data

General
Structure Double Plunger Probe
Type/family FP-D
Pitch (mm/mil) 0,35 / 14
Temperature -45°C...+150°C
Dimensions
Total length (mm) 5.7
Protrusion height (mm) 1.1
Tip style diameter (mm) 0.16
Barrel diameter (mm) 0.28
Tip style diameter (mm) 2 0.13
Materials and surfaces
Tip style 29
Tip style 2 03
Plunger material Palladium
Plunger plating Uncoated
Barrel material Bronze
Barrel plating Gold
Spring material High-grade steel
Spring plating Gold
Plunger material 2 Steel
Plunger plating 2 Gold
Mechanical specifications
Preload (cN) 10
Spring force (cN) 20
Nominal travel (mm) 0.8
Maximum travel (mm) 1
Electrical specifications
Continuous current (A) 1.4
Typical contact resistance (mOhm) 100
Frequency (GHz) 7.3

Graphics

FP280D2903P016U020L057 Family designation FP280D2903P016U020L057 Tip style 1 FP280D2903P016U020L057 Tip style 2

Beschreibung des Produkts

The Fine Pitch Double Plunger Probe FP280D2903P016U020L057 (item number 1081003) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP280D2903P016U020L057 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP280D2903P016U020L057, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.35 mm / 14 mil, spring force 20 cN, continuous current 1.4 A.