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F77217B300G150 Perspective 1 F77217B300G150 Perspective 2

Basic Contact Probes (100 mil) F77217B300G150

Item number 1087307

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family F772
Pitch (mm/mil) 2,54 / 100
Temperature -45°C...+80°C
Dimensions
Total length (mm) 32
Protrusion height (mm) 10
Tip style diameter (mm) 3
Barrel diameter (mm) 1.66
Collar diameter (mm) 2.04
Press ring diameter (mm) 2.04
Materials and surfaces
Tip style 17
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Nickel silver
Barrel plating Gold
Spring material Spring steel
Spring plating Silver
Mechanical specifications
Preload (cN) 60
Spring force (cN) 150
Nominal travel (mm) 4
Maximum travel (mm) 5
Pointing accuracy +/- (mm) 0.08
Electrical specifications
Continuous current (A) 5
Typical contact resistance (mOhm) 25

Graphics

F77217B300G150 Family designation F77217B300G150 Tip style 1

Beschreibung des Produkts

F77217B300G150 (item number 1087307) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 17 (Flat stepped), F77217B300G150 combines ICT/FCT use with a geometry intended for solder pads and contact pins. F77217B300G150 combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 3 mm. For F77217B300G150, spring force is 150 cN at a nominal travel of 4 mm. The electrical rating of F77217B300G150 combines 5 A continuous current with 25 mΩ typical contact resistance. The plunger in F77217B300G150 is made of beryllium copper and is gold-plated.