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FP650D0301B035G030L057 Perspective 1 FP650D0301B035G030L057 Perspective 2

Fine Pitch Probes (> 500 µm) FP650D0301B035G030L057

Item number 1131068

Technical data sheet

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Technical data

General
Structure Double Plunger Probe
Type/family FP-D
Pitch (mm/mil) 0,80 / 31
Temperature -45°C...+150°C
Dimensions
Total length (mm) 5.7
Protrusion height (mm) 1.1
Tip style diameter (mm) 0.35
Barrel diameter (mm) 0.65
Tip style diameter (mm) 2 0.35
Materials and surfaces
Tip style 03
Tip style 2 03
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Bronze
Barrel plating Gold
Spring material High-grade steel
Spring plating Gold
Plunger material 2 Beryllium copper
Plunger plating 2 Gold
Mechanical specifications
Preload (cN) 7
Spring force (cN) 30
Nominal travel (mm) 0.65
Maximum travel (mm) 0.85
Electrical specifications
Continuous current (A) 4
Typical contact resistance (mOhm) 50

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FP650D0301B035G030L057 Family designation FP650D0301B035G030L057 Tip style 1 FP650D0301B035G030L057 Tip style 2

Beschreibung des Produkts

The Fine Pitch Double Plunger Probe FP650D0301B035G030L057 (item number 1131068) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP650D0301B035G030L057 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP650D0301B035G030L057, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP650D0301B035G030L057 includes pitch 0.8 mm / 31 mil, spring force 30 cN, continuous current 4 A.