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FP380D1111B027L050L243 Perspective 1 FP380D1111B027L050L243 Perspective 2

Fine Pitch Probes (300µm - 500µm) FP380D1111B027L050L243

Item number 1003137

Technical data sheet

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Technical data

General
Structure Double Plunger Probe
Type/family FP-D
Pitch (mm/mil) 0,50 / 20
Temperature -45°C...+100°C
Dimensions
Total length (mm) 24.3
Protrusion height (mm) 4
Tip style diameter (mm) 0.27
Barrel diameter (mm) 0.38
Tip style diameter (mm) 2 0.27
Materials and surfaces
Tip style 11
Tip style 2 11
Plunger material Beryllium copper
Plunger plating Longtime Gold
Barrel material Bronze
Barrel plating Gold
Spring material High-grade steel
Spring plating Uncoated
Plunger material 2 Beryllium copper
Plunger plating 2 Longtime Gold
Mechanical specifications
Preload (cN) 10
Spring force (cN) 50
Nominal travel (mm) 2
Maximum travel (mm) 2.5
Pointing accuracy +/- (mm) 0.04
Electrical specifications
Continuous current (A) 1
Typical contact resistance (mOhm) 250

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FP380D1111B027L050L243 Family designation FP380D1111B027L050L243 Tip style 1 FP380D1111B027L050L243 Tip style 2

Beschreibung des Produkts

The Fine Pitch Double Plunger Probe FP380D1111B027L050L243 (item number 1003137) is designed for precise contacting where installation space is limited. Tip style 11 (Spherical) targets FP380D1111B027L050L243 at clean, sensitive contact surfaces; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP380D1111B027L050L243, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP380D1111B027L050L243 includes pitch 0.5 mm / 20 mil, spring force 50 cN, continuous current 1 A.