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F04033S038P080HP Perspective 1 F04033S038P080HP Perspective 2

Basic Contact Probes (40 mil) F04033S038P080HP

Item number 1140612

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family F040
Pitch (mm/mil) 1,00 / 40
Temperature -45°C...+80°C
Additional definition HP
Dimensions
Total length (mm) 35.9
Protrusion height (mm) 7
Tip style diameter (mm) 0.38
Barrel diameter (mm) 0.62
Materials and surfaces
Tip style 33
Plunger material Steel
Plunger plating Progressive
Barrel material Bronze
Barrel plating Gold
Spring material Spring steel
Spring plating Gold
Mechanical specifications
Preload (cN) 50
Spring force (cN) 80
Nominal travel (mm) 4.3
Maximum travel (mm) 6.4
Pointing accuracy +/- (mm) 0.05
Electrical specifications
Continuous current (A) 2
Typical contact resistance (mOhm) 20

Graphics

F04033S038P080HP Family designation F04033S038P080HP Tip style 1

Beschreibung des Produkts

F04033S038P080HP (item number 1140612) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 33 (Square lance 38°), F04033S038P080HP combines ICT/FCT use with a geometry intended for vias and solder pads where the edges can break through residues and oxide layers. F04033S038P080HP combines a pitch of 1 mm / 40 mil with tip style 33 (Square lance 38°) and a tip diameter of 0.38 mm. F04033S038P080HP operates with 80 cN spring force and 4.3 mm nominal travel. F04033S038P080HP is rated for 2 A continuous current with a typical contact resistance of 20 mΩ. The P/HP configuration of F04033S038P080HP pairs contamination-resistant Progressive Coating with increased spring preload so that difficult surfaces such as OSP, oxidized pads or flux-contaminated test points can be contacted more effectively.