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Device under Test (DUT)
The device under test (DUT) is the component, assembly, or system being examined as part of a testing process. Its electrical, functional, or mechanical properties are tested to ensure quality, functionality, and reliability. It serves as the central reference point in the testing procedure and is connected to and evaluated under defined conditions and Interfaces.
FAQ
It determines the deflection of the Contact Probe and thus influences spring force, contact quality, and lifetime.
All tests are directly related to the test specimen in order to ensure its quality and functionality.
Typically via Contact Probes, Test Fixtures, or specific contact systems.
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