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FP380D2903B022G024L057 Perspective 1 FP380D2903B022G024L057 Perspective 2

Fine Pitch Probes (300µm - 500µm) FP380D2903B022G024L057

Item number 1127689

Technical data sheet

Quantity

Technical data

General
Structure Double Plunger Probe
Type/family FP-D
Pitch (mm/mil) 0,50 / 20
Temperature -45°C...+150°C
Dimensions
Total length (mm) 5.7
Protrusion height (mm) 1.1
Tip style diameter (mm) 0.22
Barrel diameter (mm) 0.38
Tip style diameter (mm) 2 0.22
Materials and surfaces
Tip style 29
Tip style 2 01
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Bronze
Barrel plating Gold
Spring material High-grade steel
Spring plating Gold
Plunger material 2 Beryllium copper
Plunger plating 2 Gold
Mechanical specifications
Preload (cN) 4.5
Spring force (cN) 24
Nominal travel (mm) 0.65
Maximum travel (mm) 0.8
Electrical specifications
Continuous current (A) 1.6
Typical contact resistance (mOhm) 100
Frequency (GHz) 16.7

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FP380D2903B022G024L057 Family designation FP380D2903B022G024L057 Tip style 1 FP380D2903B022G024L057 Tip style 2

Beschreibung des Produkts

The Fine Pitch Double Plunger Probe FP380D2903B022G024L057 (item number 1127689) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP380D2903B022G024L057 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP380D2903B022G024L057, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP380D2903B022G024L057 includes pitch 0.5 mm / 20 mil, spring force 24 cN, continuous current 1.6 A.