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FP090DF0329P005U004L047 Perspective 1 FP090DF0329P005U004L047 Perspective 2

Fine Pitch Probes (< 300µm) FP090DF0329P005U004L047

Item number 1135965

Technical data sheet

Quantity

Technical data

General
Structure Double Plunger Probe
Type/family FP-DF
Pitch (mm/mil) 0,15 / 6
Dimensions
Total length (mm) 4.7
Protrusion height (mm) 0.6
Tip style diameter (mm) 0.06
Barrel diameter (mm) 0.09
Tip style diameter (mm) 2 0.06
Materials and surfaces
Tip style 03
Tip style 2 29
Plunger material Palladium
Plunger plating Uncoated
Barrel material Nickel
Barrel plating Gold
Spring material Spring steel
Spring plating Gold
Plunger material 2 Palladium
Plunger plating 2 Uncoated
Mechanical specifications
Preload (cN) 0.8
Spring force (cN) 4.5
Nominal travel (mm) 0.4
Maximum travel (mm) 0.5
Electrical specifications
Continuous current (A) 0.25
Typical contact resistance (mOhm) 600

Graphics

FP090DF0329P005U004L047 Family designation FP090DF0329P005U004L047 Tip style 1 FP090DF0329P005U004L047 Tip style 2

Beschreibung des Produkts

The Fine Pitch Double Plunger Probe FP090DF0329P005U004L047 (item number 1135965) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP090DF0329P005U004L047 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP090DF0329P005U004L047, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.15 mm / 6 mil, spring force 4.5 cN, continuous current 0.25 A.