FCT Contact Probe
FCT Contact Probes are Spring Contact Probes used infunctional test (FCT) systems to establish electrical connections between the test system and the assembly. They enable the transmission of signals, voltages, and currents during the functional testing of electronic assemblies under real operating conditions. With defined contact force and precise contact tips, FCT Contact Probes ensure stable and reproducible electrical contact in the Test Fixture.
FAQ
While ICT Contact Probes primarily make contact with test points on printed circuit boards, FCT Contact Probes are often used to make contact with connectors, Interfaces, or functional signals during operational testing.
Key features include stable contact, defined spring force, low contact resistance, and high cycle life.
They are used in Test Fixtures for automated test systems to test assemblies under real operating conditions.
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