ICT Contact Probe
ICT Contact Probes are Spring Contact Probes used in in-circuit test (ICT) systems to establish electrical connections to test points on printed circuit boards. They enable the testing of component values, short circuits, open circuits, and polarity directly on the assembled printed circuit board. With defined contact force and precise contact tips, ICT Contact Probes ensure reliable and reproducible electrical contact in the Test Fixture.
FAQ
Key features include defined spring force, low Contact resistance, high cycle life, and tip styles suitable for various test points.
ICT Contact Probes are specifically designed for dense test point arrays on printed circuit boards and have a typical application in bed-of-nails test systems.
ICT Contact Probes ensure stable electrical connections through defined spring force and low contact resistance, thereby enabling precise and reproducible measurement results in the In-Circuit Test.
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