Fine Pitch Probe
A Fine Pitch Contact Probe or Fine Pitch Contact Probe is a specially developed Contact Probe for very small grid spacings and high packing densities. It is used in particular for testing miniaturized electrical components such as semiconductors, Sensors, and micro-PCBs. Due to the narrow contact geometries, the use of Fine Pitch Contact Probes requires a particularly precise design of the Test Fixture as well as exact positioning and high manufacturing accuracy.
FAQ
Fine Pitch Probes are mainly used in test and inspection systems for components with high connection density. Typical applications include testing semiconductors, Sensors, and other miniature components where conventional Contact Probes are not suitable due to the small spacing.
The use of Fine Pitch Probes requires a particularly precise design of the Test Fixture. Precise positioning, uniform spring forces, and high mechanical and electrical reliability are crucial to ensure reproducible measurement results.
Regular cleaning and visual inspection help to identify contact problems at an early stage. Timely replacement of worn pins contributes to consistent test quality.
Further terms
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