Technical data
| General | |
|---|---|
| Structure | Double Plunger Probe |
| Type/family | FP-D |
| Pitch (mm/mil) | 0,30 / 12 |
| Temperature | -45°C...+150°C |
| Dimensions | |
|---|---|
| Total length (mm) | 3.7 |
| Protrusion height (mm) | 0.7 |
| Tip style diameter (mm) | 0.12 |
| Barrel diameter (mm) | 0.2 |
| Tip style diameter (mm) 2 | 0.12 |
| Materials and surfaces | |
|---|---|
| Tip style | 29 |
| Tip style 2 | 01 |
| Plunger material | Palladium |
| Plunger plating | Uncoated |
| Barrel material | Nickel |
| Barrel plating | Gold |
| Spring material | High-grade steel |
| Spring plating | Gold |
| Plunger material 2 | Beryllium copper |
| Plunger plating 2 | Gold |
| Mechanical specifications | |
|---|---|
| Preload (cN) | 9 |
| Spring force (cN) | 14 |
| Nominal travel (mm) | 0.25 |
| Maximum travel (mm) | 0.35 |
| Electrical specifications | |
|---|---|
| Continuous current (A) | 0.7 |
| Typical contact resistance (mOhm) | 100 |
| Frequency (GHz) | 35 |
Graphics
Beschreibung des Produkts
The Fine Pitch Double Plunger Probe FP200D2901P012U014L037 (item number 1030191) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP200D2901P012U014L037 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP200D2901P012U014L037, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.3 mm / 12 mil, spring force 14 cN, continuous current 0.7 A.