Data privacy settings

We use cookies to offer you the best possible user experience. These are only used to analyze website visits and are never forwarded to third parties.

Necessary

Necessary cookies are required for the website’s basic functions. These cookies ensure that the website operates properly.

Name cookie_optin
Provider FEINMETALL
Expiration 1 year
Purpose Saves the user’s cookie authorization for the current domain.
Performance

Performance cookies collect anonymized data to help website operators understand how visitors use their website.

Name _ga
Provider Google LLC
Expiration 2 years
Purpose Used for identification of unique users.
Name _gid
Provider Google LLC
Expiration 24 hours
Purpose Used for identification of the user.
Privacy
Website search:

To search for products, please use the search in the product finder.

Language:
Deutsch English
Saved Products ( Products):
Request products To Product Finder
Home › Products › Product Finder › ViProbe®
Semiconductor testing (Wafer Testing)

ViProbe®

Customizable to an enormous range of applications and probing materials it is the vertical solution in the market for many years and especially appreciated for its unique simple reparability.

Technical data

Specifications
Min. pitch of the DUT 56 µm
Min. diameter of the plunger 1,6 mil
Max. contact surface 80 mm x 80 mm
Temperature -55°C...+180°C
Current carrying capability at RT 800 mA
Contact force at rec. OD 2,4 cN - 10,7 cN
Material compatibilities
Material compatibility 1 Gold
Material compatibility 2 Palladium
Material compatibility 3 Diverse
Material compatibility 4 Solder ball
Material compatibility 5 Aluminium
Material compatibility 6 Copper

Probe Card Service

Solutions that go well beyond the product. Learn more about our Probe Card Service.

Discover our Probe Card Service
FEINMETALL Probe Card Service