Language:
Bookmark list ( Products):
Semiconductor testing (Wafer Testing)

ViProbe® II

With multiple lifetime extension options and various security features for the wafer, the ViProbe®II brings all the advantages of the ViProbe® to the next level

Technical data

Specifications
Min. pitch of the test item 50 µm
Minimum diameter of the contact element 1,6 mil
Max. contact area 105 mm x 105 mm
Temperature -55°C...+180°C
Current carrying capacity at room temperature 800 mA
Contact force at recommended delivery 2,4 cN - 10,8 cN
Contact materials
Contact material 1 Gold
Contact material 2 Palladium
Contact material 3 Diverse
Contact material 4 Solder ball
Contact material 5 Aluminium
Contact material 6 Copper

Probe Card Service

Solutions that go far beyond the product. Learn more about our Probe Card Service here.

FEINMETALL Probe Cards Service