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ViProbe® II Perspective 1

Semiconductor testing (Wafer Testing) ViProbe® II

ViProbe® II integrates proven ViProbe® technology with enhanced features for extended lifetime and wafer safety.

Technical data

Specifications
Min. pitch of the test item 50 µm
Minimum diameter of the contact element 1,6 mil
Max. contact area 105 mm x 105 mm
Temperature -55°C...+180°C
Current carrying capacity at room temperature 800 mA
Contact force at recommended delivery 2,4 cN - 10 cN
Contact materials
Contact material 1 Gold
Contact material 2 Palladium
Contact material 3 Diverse
Contact material 4 Solder ball
Contact material 5 Aluminium
Contact material 6 Copper

Probe Card Service

Solutions that go far beyond the product. Learn more about our Probe Card Service here.

FEINMETALL Probe Cards Service