Tip style
The tip style describes the geometric design of a Contact Probe’s tip. It is adapted to the respective contact surface and influences the distribution of contact force, penetration depth, and wear during repeated test cycles. The right tip style ensures reliable electrical contact even on different test point surfaces. Typical tip styles include, for example, spade, wafer, or crown.
FAQ
Different surfaces such as pads, conductor tracks, or pins require specific geometries to ensure stable electrical contacts.
The tip style influences how the Contact Probe touches the surface of the Test Point, performs Oxide Layer Penetration, and establishes a stable electrical connection.
The selection depends on factors such as probe tip shape, Pitch (grid), surface, spring force, and number of test cycles.
Further terms
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