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Home › Glossary › LiProbe®
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LiProbe®

LiProbe® is a test card solution from FEINMETALL featuring MEMS-based lamellar contacts (lamellar beams) for precise contacting in Radio Frequency and high-current applications.

The lamellar beams enable flexible beam designs with variable cross-sections and offer high Signal integrity at frequencies ranging from MHz to GHz. Thanks to their compact design and adjustable number of lamellae, LiProbe® contacts ensure precise contact, high signal quality, and reliable test results.

Our Probe Cards About the business unit
FEINMETALL LiProbe® Glossary

FAQ

Lamella beams enable flexible contact geometries, high current carrying capacity, and stable RF signal transmission.

LiProbe® is used in particular for RF wafer testing, High Current Testing, and demanding semiconductor testing.

LiProbe® is used in particular for RF wafer testing, High Current Testing, and demanding semiconductor testing.

Further terms

FeinProbe® Probe Card Semiconductor Testing ViProbe® ViProbe® II Back to the glossary

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