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Home › Glossary › ViProbe® II
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ViProbe® II

ViProbe® II is a vertical probe card solution from FEINMETALL for demanding wafer testing in the Semiconductor Industry. It expands upon the proven ViProbe® with additional options for extending service life and improving protection of the DUT (Device Under Test).

The ViProbe® II offers high reliability, excellent Signal integrity, and secure contact, making it particularly suitable for demanding semiconductor testing.

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FEINMETALL ViProbe® II Glossary

FAQ

It offers options for extending service life and improved protection for the DUT in demanding test conditions.

ViProbe® II is used in the wafer testing process in semiconductor manufacturing to electrically test chips on the wafer before they are separated and further processed.

The test card solution can be used for various semiconductor technologies and wafer types, for example for logic, analog, or mixed-signal applications.

Further terms

FeinProbe® LiProbe® Probe Card Semiconductor Testing ViProbe® Back to the glossary

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