Probe Card
A Probe Card is a contact unit used in automated test systems to precisely transmit electrical signals between the test system and the device under test—such as a wafer or semiconductor component. It contains Contact Probes or special contact structures and enables reproducible contact with many test points simultaneously. Probe Cards are designed for high signal integrity, precise positioning, and stable measurement conditions.
FEINMETALL’s portfolio includes various test probe solutions, such as ViProbe®, ViProbe® II, FeinProbe®, and LiProbe®. These solutions utilize different contact technologies, such as Spring Contact Probes or MEMS lamellar contacts, and are designed for demanding applications such as Wafer Testing, Radio Frequency Testing, or High Current Testing.
FAQ
A Probe Card contains Contact Probes, contact structures, or special contact technologies for precise signal transmission.
Probe Cards must ensure precise positioning of the contact points, high Signal integrity, low transition resistance, and high Repeatability in the test process.
FEINMETALL's test card solutions include ViProbe®, ViProbe® II, FeinProbe®, and LiProbe®, which were developed for various semiconductor and wafer testing applications.
Further terms
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