Spring-loaded Contact Probe
A spring-loaded Contact Probe (Spring Contact Probe) is a contacting component consisting of a Plunger, spring, and Barrel that is used to establish an electrical connection between Test Points.
Thanks to its defined spring travel, the Contact Probe (Test Probe) compensates for mechanical tolerances and ensures a constant Contact force. This results in stable transition resistances and reproducible measurement results.
Spring-loaded Contact Probes are used in test systems, Test Fixtures, and Probe Cards and form the basis of modern contact solutionsin electronic testing.
FAQ
Thanks to their spring-loaded design, spring-loaded Contact Probes are insensitive to tolerances, vibration-resistant, and enable reproducible measurement results even during frequent contact cycles.
Important selection criteria include spring force, spring travel, Tip style, pitch, electrical properties, and the lifetime of the Contact Probe.
They compensate for height differences and tolerances and ensure stable, repeatable contact even with varying component geometries.
Any further questions?
Whether you have questions, suggestions, or requests, we are here to advise and support you.
