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FeinProbe® Perspective 1

Semiconductor testing (WLCSP) FeinProbe®

FeinProbe® combines spring contact pins with probe card technology for precise bump contacting on WLCSP, SiP, and flip-chip wafers.

Technical data sheet

Technical data

Specifications
Min. pitch of the test item 150 µm
Minimum diameter of the contact element 70 µm
Max. contact area 80 mm x 80 mm
Temperature -40°C...+150°C
Current carrying capacity at room temperature 2100 mA
Contact force at recommended delivery 4,5 cN - 15,1 cN
Bandwidth analog at -1dB limit 100 GHz
Contact materials
Contact material 1 Gold
Contact material 2 Solder ball
Contact material 3 Copper

Probe Card Service

Solutions that go far beyond the product. Learn more about our Probe Card Service here.

FEINMETALL Probe Cards Service