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Semiconductor testing (WLCSP)

FeinProbe®

Probing WLCSP, SiP or flipchip wafers requires probes withstanding high current while simultaneously assuring high signal integrity. The FEINMETALL FeinProbe® addresses those applications with excellence.

Technical data

Specifications
Min. pitch of the test item 150 µm
Minimum diameter of the contact element 120 µm
Max. contact area 80 mm x 80 mm
Temperature -40°C...+150°C
Current carrying capacity at room temperature 2100 mA
Contact force at recommended delivery 10 cN -18 cN
Bandwidth analog at -1dB limit 100 GHz
Contact materials
Contact material 1 Gold
Contact material 2 Solder ball
Contact material 3 Copper

Probe Card Service

Solutions that go far beyond the product. Learn more about our Probe Card Service here.

FEINMETALL Probe Cards Service