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Home › Products › Product Finder › LiProbe®
Semiconductor testing (Wafer Testing)

LiProbe®

Lamella probes offer various advantages in terms of RF and force requirements. The short length of the probe as well as the flexible amount of lamellae makes it the perfect solution for sophisticated applications.

Technical data

Specifications
Min. pitch of the test item 60 µm
Max. contact area 105 mm x 105 mm
Temperature -55°C...+180°C
Current carrying capacity at room temperature 1300 mA
Contact force at recommended delivery 1,4 cN - 3,8 cN
Bandwidth analog at -1dB limit 100 GHz
Contact materials
Contact material 1 Gold
Contact material 2 Palladium
Contact material 3 Diverse
Contact material 4 Solder ball
Contact material 5 Aluminium
Contact material 6 Copper

Probe Card Service

Solutions that go far beyond the product. Learn more about our Probe Card Service here.

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FEINMETALL Probe Cards Service