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LiProbe® Perspective 1

Semiconductor testing (Wafer Testing) LiProbe®

MEMS lamella beams enable highly flexible beam designs with variable cross-sections for demanding high-frequency and high-current applications.

Technical data

Specifications
Min. pitch of the test item 60 µm
Max. contact area 105 mm x 105 mm
Temperature -55°C...+180°C
Current carrying capacity at room temperature 1300 mA
Contact force at recommended delivery 1,4 cN - 3,8 cN
Bandwidth analog at -1dB limit 100 GHz
Contact materials
Contact material 1 Gold
Contact material 2 Palladium
Contact material 3 Diverse
Contact material 4 Solder ball
Contact material 5 Aluminium
Contact material 6 Copper

Probe Card Service

Solutions that go far beyond the product. Learn more about our Probe Card Service here.

FEINMETALL Probe Cards Service