Progressive tip style
A progressive tip style is a specially designed tip geometry for a Contact Probe, developed for demanding contact conditions in printed circuit board testing. It determines how the contact tip engages with the Test Point, solder joint, or contact area.
Depending on the design, the tip style can help mechanically penetrate flux residues, oxide layers, or contaminants more effectively. This supports reliable electrical contact even on surfaces that are difficult to contact.
In the Progressive Series, the tip style is combined with Progressive Coating and increased spring preload. This combination is designed to make Contact Probes more durable and to support stable testing processes under difficult conditions.
FAQ
The tip style determines how the contact tip strikes the Test Point and how effectively it can penetrate residues or Oxide Layers.
In the presence of flux residues, oxide layers, or contaminants, the right Tip style can help establish a stable electrical connection.
In the Progressive Series, the tip style is combined with Progressive Coating and increased spring preload to better handle difficult contact conditions.
Further terms
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