Crown head
A crown head is a type of Contact Probe tip style in which the contact tip has multiple defined contact points. This shape resembles a crown and is used to mechanically make contact with test or solder points at multiple locations simultaneously.
In printed circuit board testing, a crown head can help better penetrate oxide layers, flux residues, or other contaminants at contact points. The multiple contact points distribute the contact force evenly and facilitate the electrical connection to the Test Point.
Depending on the design, a crown head can have different geometries, such as a 3-point, 4-point, 6-point, or 8-point crown head. In the Progressive Series, these tip styles are combined with Progressive Coating and increased spring preload to reliably handle demanding contact conditions.
FAQ
It is used to mechanically and securely access test or solder points and to establish a reliable electrical connection.
Depending on the application, there are different variants, such as 3-point, 4-point, 6-point, or 8-point crown heads.
A self-cleaning crown head is designed to reduce contamination at the contact tip or to better dissipate it.
Further terms
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